Manuscript accepted on :
Published online on: 04-02-2016
Anarbayev Alibek Yersainovich, Antontsev Alexandr Vitalievich and Shaikhin Agibai Kaliakovich
Kazakh National Technical University After K.I. Satpayev, Republic of Kazakhstan, 050013, Almaty city, Satpayev street 22a, Russia.
ABSTRACT: This paper describes the direct and indirect methods of assessing the influence of ultra-short electromagnetic pulses on integrated circuits. Stability of electronic equipment and its components under ultra-short electromagnetic pulses and ultrahigh frequency radiation has been experimentally assessed. Various dependencies of the indicator of some integrated circuits malfunction within the duration of ultra-short electromagnetic pulses and ultrahigh frequency energy have been assessed.
KEYWORDS: Radioelectronic system; Ultra-short electromagnetic pulse; Ultrahigh frequency radiation; Integrated circuit; performance index
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| Copy the following to cite this article: Yersainovich A. A, Vitalievich A. A, Kaliakovich S. A.Methods of Assessing the Influence of Ultrashort Electromagnetic Pulses and Ultrahigh Frequency Radiation on Integrated Circuits. Biosci Biotech Res Asia 2015;12(1) |
| Copy the following to cite this URL: Yersainovich A. A, Vitalievich A. A, Kaliakovich S. A.Methods of Assessing the Influence of Ultrashort Electromagnetic Pulses and Ultrahigh Frequency Radiation on Integrated Circuits. Biosci Biotech Res Asia 2015;12(1).Available from: https://www.biotech-asia.org/?p=6140> |
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